ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,449, issued on June 23, was assigned to GE VERNOVA INFRASTRUCTURE TECHNOLOGY LLC (Greenville, S.C.). "Device for measuring temperature grad... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,450, issued on June 23, was assigned to ZHEJIANG UNIVERSITY (Hangzhou, China). "Non-intrusive load monitoring method based on V-I trajector... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,451, issued on June 23, was assigned to Hyundai Mobis Co. Ltd. (Seoul, South Korea) and Research & Business Foundation Sungkyunkwan Universi... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,452, issued on June 23. "Unidentified aerial phenomena field disturbance detector" was invented by William Samuel Dipoala (Fairport, N.Y.).... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,453, issued on June 23, was assigned to Commissariat a l'Energie Atomique et aux Energies Alternatives (Paris). "Electromagnetic field prob... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,454, issued on June 23, was assigned to NXP B.V. (Eindhoven, Netherlands). "Semiconductor device having electromagnetic interference (EMI) ... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,455, issued on June 23, was assigned to STMicroelectronics S.r.l. (Agrate Brianza, Italy). "Radiofrequency detector circuit and correspondi... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,456, issued on June 23, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "In-situ electric field detection method and apparatu... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,457, issued on June 23, was assigned to Rockwell Automation Technologies Inc. (Mayfield Heights, Ohio). "Fault-managed power via black-chan... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,458, issued on June 23, was assigned to AMCAD ENGINEERING (Limoges, France). "Method for characterizing in pulse mode a III-V semiconductor... और पढ़ें